Recent Progress in Lithium Niobate: Optical Damage, Defect Simulation, and On-Chip Devices

Author(s)
Yongfa Kong, Fang Bo, Weiwei Wang, Dahuai Zheng, Hongde Liu, Guoquan Zhang, Romano Rupp, Jingjun Xu
Organisation(s)
Physics of Functional Materials
Journal
Advanced Materials
No. of pages
14
ISSN
0935-9648
DOI
https://doi.org/10.1002/adma.201806452
Publication date
07-2019
Publication status
E-pub ahead of print
Peer reviewed
Yes
Austrian Fields of Science 2012
103018 Materials physics, 102009 Computer simulation
Keywords
defect simulation calculation, integrated photonics, lithium niobate, on-chip devices, optical damage resistance, THIN-FILM, WAVE-GUIDES, HOLOGRAPHIC STORAGE, HIGH-RESISTANCE, ULTRAVIOLET PHOTOREFRACTION, 2ND-HARMONIC GENERATION, MICRODISK RESONATORS, COMPUTER-SIMULATION, INTRINSIC DEFECTS, GRATING COUPLER
Portal url
https://ucris.univie.ac.at/portal/en/publications/recent-progress-in-lithium-niobate-optical-damage-defect-simulation-and-onchip-devices(1c67f21a-ee5e-4cc2-af85-68f90efa7d85).html